NTRS - NASA Technical Reports Server
Investigation of low glass transition temperature on COTS PEM's reliability for space applicationsPlastic Encapsulated Microelectronics (PEM) reliability is affected by many factors. Glass transition temperature (Tg) is one such factor. In this presentation issues relating to PEM reliability and the effect of low glass transition temperature epoxy mold compounds are presented.
Cooper, M. S.
August 23, 2013
May 11, 2003
glass transition temperature reliability PEM