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Continuing evaluation of bipolar linear devices for total dose bias dependency and ELDRS effectsWe present results of continuing efforts to evaluate total dose bias dependency and ELDRS effects in bipolar linear microcircuits. Several devices were evaluated, each exhibiting moderate to significant bias and/or dose rate dependency.
Document ID
20060040030
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
hdl:2014/7100
Authors
McClure, S. S.
Gorelick, J. J.
Yui, C. C.
Rax, B. G.
Wiedeman, M. D.
Date Acquired
August 23, 2013
Publication Date
July 21, 2003
Subject Category
Space Radiation
Distribution Limits
Public
Copyright
Other
Keywords
dependency
ELDRS total dose bias dependency bipolar linear microcircuits dose rate

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