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Investigation of low glass transition temperature on COTS PEMs reliabilityMany factors influence PEM component reliability.One of the factors that can affect PEM performance and reliability is the glass transition temperature (Tg) and the coefficient of thermal expansion (CTE) of the encapsulant or underfill. JPL/NASA is investigating how the Tg and CTE for PEMs affect device reliability under different temperature and aging conditions. Other issues with Tg are also being investigated. Some preliminary data will be presented on glass transition temperature test results conducted at JPL.
Document ID
20060040226
Document Type
Conference Paper
External Source(s)
Authors
Sandor, M.
Agarwal, S.
Date Acquired
August 23, 2013
Publication Date
August 6, 2002
Distribution Limits
Public
Copyright
Other
Keywords
Glass transition temperature PEMs