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Enhanced Low Dose Rate Effects in Bipolar Circuits: A New Hardness Assurance Problem for NASAMany bipolar integrated circuits are much more susceptible to ionizing radiation at low dose rates than they are at high dose rates typically used for radiation parts testing. Since the low dose rate is equivalent to that seen in space, the standard lab test no longer can be considered conservative and has caused the Air Force to issue an alert. Although a reliable radiation hardness assurance test has not yet been designed, possible mechanisms for low dose rate enhancement and hardness assurance tests are discussed.
Document ID
20060042073
Acquisition Source
Jet Propulsion Laboratory
Document Type
Preprint (Draft being sent to journal)
External Source(s)
Authors
Johnston, A.
Barnes, C.
Date Acquired
August 23, 2013
Publication Date
January 1, 1995
Subject Category
Electronics And Electrical Engineering
Distribution Limits
Public
Copyright
Other
Keywords
bipolar integrated circuits

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