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Reliability of COTS MEMS accelerometer under shock and thermomechanical cyclingA comparison of the data from microaccelerometers of the same type and between several types will be presented. Self-test output signals and X-ray evaluation test data after completion of 182 thermal cycles will also be presented.
Document ID
20060042412
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
hdl:2014/36836
Authors
Teverovsky, A.
Ghaffarian, R.
Sutton, D. G.
Chaffee, P.
Marquez, N.
Sharma, A. K.
Date Acquired
August 23, 2013
Publication Date
September 1, 2001
Distribution Limits
Public
Copyright
Other
Keywords
MEMS thermal cycling microaccelerometers

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