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Design and operational considerations for robust planar GaAs varactors: a reliability studyThis paper will describe on-going investigations into the effects of excessive reverse currents in Schottky diodes along with presenting a methodology for determining safe bias conditions for a given multiplier.
Document ID
20060043232
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
hdl:2014/38624
Authors
Maiwald, Frank
Schlecht, Erich
Ward, John
Lin, Robert
Leon, Rosa
Pearson, John
Mehdi, Imran
Date Acquired
August 23, 2013
Publication Date
April 1, 2003
Subject Category
Electronics And Electrical Engineering
Distribution Limits
Public
Copyright
Other
Keywords
THz frequencies
Schottky diode multipliers

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