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Endurance cycling results in extreme environmentsA new test bed for life testing flash memories in extreme environments is introducted. the test bed is based on a state-of-the-art development board. Since space applications often desire state-of-the-art devices, such a basis seems appropriate. Comparison of this tester to other such systems, including those with data presented here in the past is made. Limitations of different testers for varying applications are discussed. Recently developed data, using this test bed is also presented.
Document ID
20060043279
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
Authors
Guertin, S. M.
Nguyen, D. N.
Scheick, L. Z.
Date Acquired
August 23, 2013
Publication Date
November 1, 2003
Meeting Information
Meeting: 2003 Non-volatile Memory Technology Symposium
Location: San Diego, CA
Country: United States
Start Date: November 12, 2003
End Date: November 13, 2003
Distribution Limits
Public
Copyright
Other
Keywords
microelectronics
life testing of memory
radiation effects

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