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MSTAR: an absolute metrology sensor with sub-micron accuracy for space-based applicationsThe MSTAR sensor is a new system for measuring absolute distance, capable of resolving the integer cycle ambiguity of standard interferometers, and making it possible to measure distance with subnanometer accuracy.
Document ID
20060043378
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
hdl:2014/38224
Authors
Peters, Robert D.
Lay, Oliver P.
Dubovitsky, Serge
Burger, Johan P.
Jeganathan, Muthu
Date Acquired
August 23, 2013
Publication Date
March 1, 2004
Meeting Information
Meeting: 5th International Conference on Space Optics
Location: Toulouse
Country: France
Start Date: March 30, 2004
Distribution Limits
Public
Copyright
Other
Keywords
absolute metrology
distance measurement

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