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Continuing evaluation of bipolar linear devices for total dose bias dependency and ELDRS effectsWe present results of continuing efforts to evaluate total dose bias dependency and ELDRS effects in bipolar linear microcircuits. Several devices were evaluated, each exhibiting moderate to significant bias and/or dose rate dependency.
Document ID
20060043444
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
hdl:2014/38621
Authors
McClure, Steven S.
Gorelick, Jerry L.
Yui, Candice
Rax, Bernard G.
Wiedeman, Michael D.
Date Acquired
August 23, 2013
Publication Date
July 1, 2003
Subject Category
Space Radiation
Meeting Information
Meeting: Nuclear and Space Radiation Effects (NSREC) Conference
Location: Monterey, CA
Country: United States
Start Date: July 21, 2003
Distribution Limits
Public
Copyright
Other
Keywords
low dose rate testing
bipolar linear
ELDRS

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