Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
Date Acquired
August 23, 2013
Publication Date
April 12, 2004
Subject Category
Cybernetics, Artificial Intelligence And Robotics Meeting Information
Meeting: International Society for Optical Engineering (SPIE) Defense and Security Symposium, Optical Pattern Recognition XV
Location: Orlando, FL
Country: United States
Start Date: April 12, 2004
End Date: April 16, 2004
Distribution Limits
Public
Keywords
feature extractionautonomous trackingneural networkdata reductionfeature detectortarget recognition