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Corner cube model for internal metrology system of Space Interferometer Mission (SIM)A corner cube (CC) articulation model has been developed to evaluate the SIM internal metrology (IntMet) optical delay bias (with the accuracy of picometer) due to the component imperfections, such as vertex offset, reflection coating index error, dihedral error, and surface figure error at each facet. This physics-based and MATLAB-implemented geometric optics model provides useful guidance on the flight system design, integration, and characterization. The first portion of this paper covers the CC model details. Then several feature of the model, such as metrology beam footprint visualization, roofline straddling/crossing analysis, and application to drive the sub-system design and the error budget flow-down, are demonstrated in the second part.
Document ID
20060044158
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
Authors
Wang, Xu
Korechoff, Robert
Heflin, Mike
Sievers, Lisa
Date Acquired
August 23, 2013
Publication Date
May 24, 2006
Subject Category
Instrumentation And Photography
Meeting Information
Meeting: International Society for Optical Engineering (SPIE) Astronomical Telescopes and Instrumentation
Location: Orlando, FL
Country: United States
Start Date: May 24, 2006
End Date: May 31, 2006
Distribution Limits
Public
Copyright
Other
Keywords
Corner cube,
laser metrology
interferometer.
picometer metrology

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