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Experimentally derived resistivity for dielectric samples from the CRRES internal discharge monitorResistivity values were experimentally determined using charge storage methods for six samples remaining from the construction of the Internal Discharge Monitor (IDM) flown on the Combined Release and Radiation Effects Satellite (CRRES). Three tests were performed over a period of four to five weeks each in a vacuum of -5x10^-6 torr with an average temperature of -25 (deg)C to simulate a space environment.
Document ID
20060044280
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
Authors
Green, Nelson W.
Frederickson, A. Robb
Dennison, J. R.
Date Acquired
August 23, 2013
Publication Date
April 4, 2005
Meeting Information
Meeting: 9th Spacecraft Chraging Technology Conference
Location: Tsukuba
Country: Japan
Start Date: April 4, 2005
End Date: April 8, 2005
Distribution Limits
Public
Copyright
Other
Keywords
spacecraft charging
electrons
Combined Release and Radiation Effects Satellite (CRRES).
resistivity

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