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Record Details

Record 47 of 16524
Absolute optical metrology : nanometers to kilometers
External Online Source: hdl:2014/39491
Author and Affiliation:
Dubovitsky, Serge
Lay, O. P.
Peters, R. D.
Liebe, C. C.
Abstract: We provide and overview of the developments in the field of high-accuracy absolute optical metrology with emphasis on space-based applications. Specific work on the Modulation Sideband Technology for Absolute Ranging (MSTAR) sensor is described along with novel applications of the sensor.
Publication Date: Jul 11, 2005
Document ID:
20060044287
(Acquired Sep 15, 2006)
Document Type: Conference Paper
Meeting Information: International Quantum Electronics Conference and Pacific Rim Conference on Lasers and Electro-Optics (IQEC/CLEO-PR 2005); July 11-15, 2005; Tokyo; Japan
Financial Sponsor: Jet Propulsion Lab., California Inst. of Tech.; Pasadena, CA, United States
Description: In English
Distribution Limits: Unclassified; Publicly available; Unlimited
Rights: Copyright
NASA Terms: METROLOGY; MODULATION; RANGEFINDING; SIDEBANDS
Other Descriptors: OPTICAL METROLOGY
Availability Source: Other Sources
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