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Preliminary low temperature tests of a digital signal processorThis paper describes an initial experiment performed to assess the electrical behavior of the Innovative Integration board containing a Digital Signal Processor (DSP) with its JTAG (Blackhawk) connector at low temperatures. The objective of the experiment is to determine the lowest temperature at which the DSP can operate. The DSP was tested at various low-temperatures and a Genetic Algorithm was used as the DSP test program.
Document ID
20060044389
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
hdl:2014/39587
Authors
Zebulum, Ricardo S.
Ramesham, Rajeshuni
Stoica, Adrian
Keymeulen, Didier
Daud, Taher
Sekanina, Lukas
Date Acquired
August 23, 2013
Publication Date
February 21, 2005
Meeting Information
Meeting: IMAPS Advanced Technology Workshop on Reliability of Advanced Electronic Pakages and Devices in Extreme Cold Temperatures
Location: Pasadena, CA
Country: United States
Start Date: February 21, 2005
End Date: February 23, 2005
Distribution Limits
Public
Copyright
Other
Keywords
temperatures
Digital Signal Processor (DSP)

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