NASA Logo, External Link
Facebook icon, External Link to NASA STI page on Facebook Twitter icon, External Link to NASA STI on Twitter YouTube icon, External Link to NASA STI Channel on YouTube RSS icon, External Link to New NASA STI RSS Feed AddThis share icon
 

Record Details

Record 12 of 8697
Single-Event Upset and Scaling Trends in New Generation of the Commercial SOI PowerPC Microprocessors
External Online Source: hdl:2014/39667
Author and Affiliation:
Irom, Farokh(Jet Propulsion Lab., California Inst. of Tech., Pasadena, CA, United States)
Farmanesh, Farhad(Jet Propulsion Lab., California Inst. of Tech., Pasadena, CA, United States)
Kouba, Coy K.(NASA Johnson Space Center, Houston, TX, United States)
Abstract: Single-event upset effects from heavy ions are measured for Motorola silicon-on-insulator (SOI) microprocessor with 90 nm feature sizes. The results are compared with previous results for SOI microprocessors with feature sizes of 130 and 180 nm. The cross section of the 90 nm SOI processors is smaller than results for 130 and 180 nm counterparts, but the threshold is about the same. The scaling of the cross section with reduction of feature size and core voltage for SOI microprocessors is discussed.
Publication Date: Jan 01, 2006
Document ID:
20060051522
(Acquired Nov 06, 2006)
Subject Category: ELECTRONICS AND ELECTRICAL ENGINEERING
Document Type: Preprint
Meeting Information: 43rd Annual International Nuclear and Space Radiation Effects Conference (NSREC); 17 Jul. 2006; Jacksonville, FL; United States
Financial Sponsor: Jet Propulsion Lab., California Inst. of Tech.; Pasadena, CA, United States
Organization Source: Jet Propulsion Lab., California Inst. of Tech.; Pasadena, CA, United States
Description: 7p; In English; Original contains black and white illustrations
Distribution Limits: Unclassified; Publicly available; Unlimited
Rights: Copyright
NASA Terms: MICROPROCESSORS; SINGLE EVENT UPSETS; SOI (SEMICONDUCTORS); SCALING; TRENDS; HEAVY IONS; CROSS SECTIONS; ELECTRIC POTENTIAL; ION BEAMS
Other Descriptors: SINGLE-EVENT UPSETS; SCALING TRENDS; CYCLOTRON; SILICON ON INSULATOR; HEAVY ION; MICROPROCESSORS
Availability Source: Other Sources
› Back to Top
Find Similar Records
NASA Logo, External Link
NASA Official: Gerald Steeman
Site Curator: STI Program
Last Modified: August 23, 2011
Contact Us