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Electron-Induced Displacement Damage Effects in CCDsWe compare differences in parametric degradation for CCDs irradiated to the same displacement damage dose with 10-MeV and 50-MeV electrons. Charge transfer efficiency degradation was observed to not scale with NIEL for small signals.
Document ID
20070011687
Acquisition Source
Jet Propulsion Laboratory
Document Type
Preprint (Draft being sent to journal)
External Source(s)
hdl:2014/39815
Authors
Becker, Heidi N.
Elliott, Tom
Alexander, James W.
Date Acquired
August 23, 2013
Publication Date
July 17, 2006
Subject Category
Space Radiation
Meeting Information
Meeting: IEEE Nuclear and Space Radiation Effects Conference (NSREC)
Location: Ponte Verde Beach, FL
Country: United States
Start Date: July 17, 2006
End Date: July 21, 2006
Sponsors: Institute of Electrical and Electronics Engineers
Distribution Limits
Public
Copyright
Other
Keywords
Juno Mission
displacement damages
electrons
Charge-coupled devices (CCDs)

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