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A Compact 600 GHz Electronically Tunable Vector Measurement System for Submillimeter Wave ImagingA compact submillimeter wave transmission / reflection measurement system has been demonstrated at 560-635 GHz, with electronic tuning over the entire band. Maximum dynamic range measured at a single frequency is 90 dB (60 dB typical), and phase noise is less than +/- 2(deg). By using a frequency steerable lens at the source output and mixer input, the frequency agility of the system can be used to scan the source and receive beams, resulting in near real-time imaging capability using only a single pixel.
Document ID
20070017434
Acquisition Source
Jet Propulsion Laboratory
Document Type
Preprint (Draft being sent to journal)
External Source(s)
hdl:2014/39830
Authors
Dengler, Robert J. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Maiwald, Frank (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Siegel, Peter H. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
August 23, 2013
Publication Date
June 11, 2006
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: IEEE Microwave Theory and Techniques Symposium
Location: San Francisco, CA
Country: United States
Start Date: June 11, 2006
End Date: June 16, 2006
Sponsors: Institute of Electrical and Electronics Engineers
Distribution Limits
Public
Copyright
Other
Keywords
submillimeter wave imaging
submillimeter wace mixers
phase measurements

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