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Reliability of Cascaded THz Frequency Chains with Planar GaAs CircuitsPlanar GaAs Schottky diodes will be utilized for all of the LO chains on the HIPI instrument for the Herschel Space Observatory. A better understanding of device degradation mechanisms is desirable in order to specify environmental and operational conditions that do not reduce device life times. Failures and degradation associated with ESD (Electrostatic Discharge), high temperatures, DC currents and RF induced current and heating have been investigated. The goal is to establish a procedure to obtain the safe operating range for a given frequency multiplier.
Document ID
20070019772
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
Authors
Maiwald, Frank
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Schlecht, Erich
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Lin, Robert
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Ward, John
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Pearson, John
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Siegel, Peter
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Mehdi, Imran
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
August 23, 2013
Publication Date
April 27, 2004
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: 15th International Symposium on Space TeraHertz Technology (STT)
Location: Amherst, MA
Country: United States
Start Date: April 27, 2004
End Date: April 29, 2004
Distribution Limits
Public
Copyright
Other
Keywords
reliability on Schottky diode multipliers
THz frequencies

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