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Comparison of Measured Leakage Current Distributions with Calculated Damage Energy Distributions in HgCdTeThis paper presents a combined Monte Carlo and analytic approach to the calculation of the pixel-to-pixel distribution of proton-induced damage in a HgCdTe sensor array and compares the results to measured dark current distributions after damage by 63 MeV protons. The moments of the Coulombic, nuclear elastic and nuclear inelastic damage distribution were extracted from Monte Carlo simulations and combined to form a damage distribution using the analytic techniques first described in [I]. The calculations show that the high energy recoils from the nuclear inelastic reactions (calculated using the Monte Car10 code MCNPX [2]) produce a pronounced skewing of the damage energy distribution. The nuclear elastic component (also calculated using the MCNPX) has a negligible effect on the shape of the damage distribution. The Coulombic contribution was calculated using MRED [3,4], a Geant4 [4,5] application. The comparison with the dark current distribution strongly suggests that mechanisms which are not linearly correlated with nonionizing damage produced according to collision kinematics are responsible for the observed dark current increases. This has important implications for the process of predicting the on-orbit dark current response of the HgCdTe sensor array.
Document ID
20070021417
Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
Marshall, C. J.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Ladbury, R.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Marshall, P. W.
(Marshall (P. W.) Brookneal, VA, United States)
Reed, R. A.
(Vanderbilt Univ. Nashville, TN, United States)
Howe, C.
(Vanderbilt Univ. Nashville, TN, United States)
Weller, B.
(Vanderbilt Univ. Nashville, TN, United States)
Mendenhall, M.
(Vanderbilt Univ. Nashville, TN, United States)
Waczynski, A.
(Global Science and Technology, Inc. Greenbelt, MD, United States)
Jordan, T. M.
(EMPC Gaithersburg, MD, United States)
Fodness, B.
(SGT, Inc. Greenbelt , MD, United States)
Date Acquired
August 23, 2013
Publication Date
January 1, 2006
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: Radiation and Its Effects on Components and Systems (RADECS) Workshop
Location: Athens
Country: Greece
Start Date: September 27, 2006
End Date: September 29, 2006
Sponsors: Institute of Electrical and Electronics Engineers
Distribution Limits
Public
Copyright
Public Use Permitted.
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