NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Collections About News Help Login
Back to Results
A Technical and Cost Perspective on Radiation Testing ChallengesA viewgraph presentation detailing costs and technical perspectives on radiation testing is shown. The topics include: 1) Introduction - a Changing Microelectronics World; 2) Sample Technology Changes and Related Impacts on Radiation Testing; 3) Perspective on the "New" Cost or Doing Business; and 4) Considerations.
Document ID
20070022329
Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
LaBel, Kenneth A. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Cohen, Lewis M. (Defense Threat Reduction Agency United States)
Date Acquired
August 23, 2013
Publication Date
December 6, 2006
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: Microelectronics Reliability and Qualification Workshop
Location: Los Angeles, CA
Country: United States
Start Date: December 6, 2006
End Date: December 7, 2006
Sponsors: Jet Propulsion Lab., California Inst. of Tech., NASA Headquarters, Aerospace Corp.
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

Related Records

There are no records associated with this record.
No Preview Available