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Ellipsometric Analysis of Contaminant Layer on Optical Witness Samples from MISSESeveral optical witness samples included in the Materials for International Space Station Experiment (MISSE) trays have been analyzed with a variable angle spectroscopic ellipsometer or VASE. Witness samples of gold or platinum mirrors are extremely useful as collectors of space-borne contamination, due to the relative inertness of these noble metals in the atomic oxygen-rich environment of LEO. Highly accurate thickness measurements, typically at the sub-nanometer scale, may be achieved with this method, which uses polarized light in a spectral range of 300 to 1300 nanometers at several angles of incidence to the sample surface.
Document ID
20070031968
Acquisition Source
Marshall Space Flight Center
Document Type
Conference Paper
Authors
Norwood, Joseph K. (NASA Marshall Space Flight Center Huntsville, AL, United States)
Date Acquired
August 23, 2013
Publication Date
June 25, 2007
Subject Category
Space Sciences (General)
Meeting Information
Meeting: 2007 National Space and Missile Materials Symposium MISSE Materials/Experiments General Dynamics Information Technology
Location: Keystone, CO
Country: United States
Start Date: June 25, 2007
End Date: June 29, 2007
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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