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Functional Recovery of Analog Circuits at Extreme TemperaturesThis paper describes a new reconfigurable analog array (RAA) architecture and integrated circuit (IC) used to map analog circuits that can adapt to extreme temperatures under programmable control. Algorithm-driven adaptation takes place on the RAA IC. The algorithms are implemented in a separate Field Programmable Gate Array (FPGA) IC, co-located with the RAA in the extreme temperature environment. The experiments demonstrate circuit adaptation over a wide temperature range, from extremely low temperature of -180 C to high 120 C.
Document ID
20070034824
Acquisition Source
Jet Propulsion Laboratory
Document Type
Preprint (Draft being sent to journal)
External Source(s)
Authors
Zebulum, Ricardo S.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Stoica, Adrian
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Keymeulen, Didier
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Ramesham, Rajeshuni
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Neff, Joseph
Katkoori, Srinivas
(University of South Florida Tampa, FL, United States)
Date Acquired
August 24, 2013
Publication Date
November 2, 2006
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: Identifier Data: Artificial Neural Networks In Engineering (ANNIE)
Location: St. Louis. MO
Start Date: November 5, 2006
End Date: November 8, 2006
Sponsors: Missouri Univ.
Distribution Limits
Public
Copyright
Other
Keywords
self-recovery
electronics
reconfigurable analog array (RAA)
extreme temperatures

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