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Absolute Distance Measurement with the MSTAR SensorThe MSTAR sensor (Modulation Sideband Technology for Absolute Ranging) is a new system for measuring absolute distance, capable of resolving the integer cycle ambiguity of standard interferometers, and making it possible to measure distance with sub-nanometer accuracy. The sensor uses a single laser in conjunction with fast phase modulators and low frequency detectors. We describe the design of the system - the principle of operation, the metrology source, beamlaunching optics, and signal processing - and show results for target distances up to 1 meter. We then demonstrate how the system can be scaled to kilometer-scale distances.
Document ID
20070035064
Acquisition Source
Jet Propulsion Laboratory
Document Type
Preprint (Draft being sent to journal)
External Source(s)
Authors
Lay, Oliver P.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Dubovitsky, Serge
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Peters, Robert
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Burger, Johan
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Ahn, Seh-Won
(University of Southern California Los Angeles, CA, United States)
Steier, William H.
(University of Southern California Los Angeles, CA, United States)
Fetterman, Harrold R.
(Pacific Wave Industries, Inc. Los Angeles, CA, United States)
Chang, Yian
(Pacific Wave Industries, Inc. Los Angeles, CA, United States)
Date Acquired
August 24, 2013
Publication Date
August 3, 2003
Subject Category
Optics
Meeting Information
Meeting: The International Society for Optical Engineering (SPIE), International Symposium on Optical Science and Technology
Location: San Diego, CA
Country: United States
Start Date: August 3, 2003
End Date: August 8, 2003
Sponsors: International Society for Optical Engineering
Distribution Limits
Public
Copyright
Other
Keywords
modulation sideband technology for absolute ranging (MSTAR)
distance measurement
absolute metrology

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