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CHAMP (Camera, Handlens, and Microscope Probe)CHAMP (Camera, Handlens And Microscope Probe)is a novel field microscope capable of color imaging with continuously variable spatial resolution from infinity imaging down to diffraction-limited microscopy (3 micron/pixel). As a robotic arm-mounted imager, CHAMP supports stereo imaging with variable baselines, can continuously image targets at an increasing magnification during an arm approach, can provide precision rangefinding estimates to targets, and can accommodate microscopic imaging of rough surfaces through a image filtering process called z-stacking. CHAMP was originally developed through the Mars Instrument Development Program (MIDP) in support of robotic field investigations, but may also find application in new areas such as robotic in-orbit servicing and maintenance operations associated with spacecraft and human operations. We overview CHAMP'S instrument performance and basic design considerations below.
Document ID
20080013217
Acquisition Source
Jet Propulsion Laboratory
Document Type
Preprint (Draft being sent to journal)
External Source(s)
Authors
Mungas, Greg S.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Boynton, John E.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Balzer, Mark A.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Beegle, Luther
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Sobel, Harold R.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Fisher, Ted
(Firestar Engineering, LLC Louisville, CO, United States)
Klein, Dan
(Coherent Technologies, Inc. United States)
Deans, Matthew
(QSS Group, Inc. Moffett Field, CA, United States)
Lee, Pascal
(NASA Ames Research Center Moffett Field, CA, United States)
Sepulveda, Cesar A.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
August 24, 2013
Publication Date
March 1, 2005
Subject Category
Instrumentation And Photography
Report/Patent Number
IEEEAC Paper-1510, Version 5
Meeting Information
Meeting: IEEE Aerospace Conference
Location: Big Sky, MT
Country: United States
Start Date: March 4, 2005
End Date: March 12, 2005
Sponsors: Institute of Electrical and Electronics Engineers
Distribution Limits
Public
Copyright
Other
Keywords
robotic field investigations
field microscope
arm mounted imager

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