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Design and Varactors: Operational Considerations. A Reliability Study for Robust Planar GaAsPreliminary conclusions include: Limits for reverse currents cannot be set. Based on current data we want to avoid any reverse bias current. We know 1 micro-A is too high. Leakage current gets suppressed when operated at 120K. Migration and verification: a) Reverse Bias Voltage will be limited; b) Health check with I/V curve: 1) Minimal reverse voltage shall be x0.75 of the calculated voltage breakdown Vbr; 2) Degradation of the Reverse Bias voltage at given current will be used as indication of ESD incidents or other Damages (high RF power, heat); 3) Calculation of diodes parameter to verify initial health check result in forward direction. RF output power starts to degrade when diode I/V curve is very strongly degraded only. Experienced on 400GHz doubler and 200GHz doubler
Document ID
20080014133
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
Authors
Maiwald, Frank
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Schlecht, Erich
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Ward, John
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Lin, Robert
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Leon, Rosa
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Pearson, John
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Mehdi, Imran
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
August 24, 2013
Publication Date
April 22, 2003
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: 14th International Symposium on Space Terahertz Technology
Location: Tucson, AZ
Country: United States
Start Date: April 22, 2003
End Date: April 24, 2003
Distribution Limits
Public
Copyright
Other
Keywords
THz frequencies
reliability
Schottky diode multipliers

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