NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
A Micromachined Geometric Moire Interferometric Floating-Element Shear Stress SensorThis paper presents the development of a floating-element shear stress sensor that permits the direct measurement of skin friction based on geometric Moir interferometry. The sensor was fabricated using an aligned wafer-bond/thin-back process producing optical gratings on the backside of a floating element and on the top surface of the support wafer. Experimental characterization indicates a static sensitivity of 0.26 microns/Pa, a resonant frequency of 1.7 kHz, and a noise floor of 6.2 mPa/(square root)Hz.
Document ID
20080018606
Acquisition Source
Langley Research Center
Document Type
Conference Paper
Authors
Horowitz, S.
(Florida Univ. Gainesville, FL, United States)
Chen, T.
(Florida Univ. Gainesville, FL, United States)
Chandrasekaran, V.
(Florida Univ. Gainesville, FL, United States)
Tedjojuwono, K.
(NASA Langley Research Center Hampton, VA, United States)
Nishida, T.
(Florida Univ. Gainesville, FL, United States)
Cattafesta, L.
(Florida Univ. Gainesville, FL, United States)
Sheplak, M.
(Florida Univ. Gainesville, FL, United States)
Date Acquired
August 24, 2013
Publication Date
January 5, 2004
Subject Category
Mechanical Engineering
Report/Patent Number
AIAA Paper 2004-1042
Meeting Information
Meeting: 42nd AIAA Aerospace Sciences Meeting
Location: Reno, NV
Country: United States
Start Date: January 5, 2008
End Date: January 8, 2008
Sponsors: American Inst. of Aeronautics and Astronautics
Funding Number(s)
OTHER: 23-752-55-MA
CONTRACT_GRANT: NAG10-316
CONTRACT_GRANT: NAG1-2133
Distribution Limits
Public
Copyright
Other

Available Downloads

There are no available downloads for this record.
No Preview Available