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Simulation of a Miniature, Low-Power Time-of-Flight Mass Spectrometer for In Situ Analysis of Planetary AtmospheresWe are implementing nano- and micro-technologies to develop a miniaturized electron impact ionization mass spectrometer for planetary science. Microfabrication technology is used to fabricate the ion and electron optics, and a carbon nanotube (CNT) cathode is used to generate the ionizing electron beam. Future NASA planetary science missions demand miniaturized, low power mass spectrometers that exhibit high resolution and sensitivity to search for evidence of past and present habitability on the surface and in the atmosphere of priority targets such as Mars, Titan, Enceladus, Venus, Europa, and short-period comets. Toward this objective, we are developing a miniature, high resolution reflectron time-of-flight mass spectrometer (Mini TOF-MS) that features a low-power CNT field emission electron impact ionization source and microfabricated ion optics and reflectron mass analyzer in a parallel-plate geometry that is scalable. Charged particle electrodynamic modeling (SIMION 8.0.4) is employed to guide the iterative design of electron and ion optic components and to characterize the overall performance of the Mini TOF-MS device via simulation. Miniature (less than 1000 cubic centimeters) TOF-MS designs (ion source, mass analyzer, detector only) demonstrate simulated mass resolutions greater than 600 at sensitivity levels on the order of 10(exp -3) cps/molecule N2/cc while consuming 1.3 W of power and are comparable to current spaceflight mass spectrometers. Higher performance designs have also been simulated and indicate mass resolutions approximately 1000, though at the expense of sensitivity and instrument volume.
Document ID
20080032737
Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
King, Todd T.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Getty, Stephanie A.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Roman, Patrick A.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Herrero, Federico
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Jones, Hollis H.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Kahle, Duncan M.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Lynch, Bernard
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Suarez, George
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Brinckerhoff, William B.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Mahaffy, Paul R.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
August 24, 2013
Publication Date
March 17, 2008
Subject Category
Instrumentation And Photography
Meeting Information
Meeting: SPIE Defense and Security Symposium
Location: Orlando, Fl
Country: United States
Start Date: March 17, 2008
End Date: March 20, 2008
Sponsors: International Society for Optical Engineering
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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