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Research Infusion Collaboration: Finding Defect Patterns in Reused CodeThe 'Finding Defect Patterns in Reused Code' Research Infusion Collaboration was performed by Jet Propulsion Laboratory/Caltech under Contract 104-07-02.679 102 197 08.14.4. This final report describes the collaboration and documents the findings, including lessons learned.The research infusion collaboration characterized, using Orthogonal Defect Classification, defect reports for code that will be reused in mission-critical software on Deep Space Network Antenna controllers. Code reuse is estimated to be 90%, so it is important to identify systemic defects, or patterns, prior to reuse of this code. The work also identified ways to avoid certain types of defects and to test more efficiently.The primary objectives of the project were:to analyze defect patterns of the code to be reused based on the defects'Orthogonal Defect Classification (ODC)and to achieve a successful infusion of ODC to a project.
Document ID
20090007664
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
Authors
Lutz, Robyn R.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Morgan, Scott
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Do, Tuan
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Mikulski, Carmen
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Berg Strain, Martha
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Rockwell, Steve
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Wilkinson, Belinda
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
August 24, 2013
Publication Date
November 18, 2004
Subject Category
Mathematical And Computer Sciences (General)
Meeting Information
Meeting: NASA Software Working Group: Research Infusion Initiatives
Location: Moffett Field, CA
Country: United States
Start Date: December 15, 2004
Distribution Limits
Public
Copyright
Other
Keywords
orthogonal defect classification (ODC)
software reuse

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