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Thermal (Silicon Diode) Data Acquisition SystemMarshall Space Flight Center's X-ray Calibration Facility (XRCF) has been performing cryogenic testing to 20 Kelvin since 1999. Two configurations for acquiring data from silicon diode temperature sensors have been implemented at the facility. The facility's environment is recorded via a data acquisition system capable of reading up to 60 silicon diodes. Test article temperature is recorded by a second data acquisition system capable of reading 150+ silicon diodes. The specifications and architecture of both systems will be presented.
Document ID
20090015856
Acquisition Source
Goddard Space Flight Center
Document Type
Abstract
Authors
Kegley, Jeffrey
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Date Acquired
August 24, 2013
Publication Date
September 22, 2008
Publication Information
Publication: 25th Space Simulation Conference. Environmental Testing: The Earth-Space Connection
Subject Category
Instrumentation And Photography
Distribution Limits
Public
Copyright
Public Use Permitted.

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