Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
Authors
Adell, Phillipe C. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Barnaby, H. J. (Arizona State Univ. Tempe, AZ, United States) Schrimpf, R. D. (Vanderbilt Univ. Nashville, TN, United States) Vermeire, B. (Arizona State Univ. Tempe, AZ, United States) Date Acquired
August 24, 2013
Publication Date
June 23, 2007
Subject Category
Electronics And Electrical Engineering Meeting Information
Meeting: Nuclear and Space Radiation Effects Conference (NSREC)
Location: Honolulu, HI
Country: United States
Start Date: July 23, 2007
End Date: July 27, 2007
Sponsors: Institute of Electrical and Electronics Engineers
Distribution Limits
Public
Keywords
high current regimefully depletedtotal ionizing doseband to band tunnelingsilicon on insulator (SOI)gate induced drain leakage (GIDL)