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Influence of Containment on Defects in GeSi CrystalsCrystals grown without being in contact with a container have superior quality to otherwise similar crystals grown in direct contact with a container, especially with respect to impurity incorporation, formation of dislocations, and residual stress in crystals. "Detached" or "dewetted" Bridgman growth is similar to regular Bridgman growth in that most of the melt is in contact with the crucible wall, but the crystal is separated from the wall by a small gap, typically of the order of 10(exp -5) m. A small meniscus bridges the gap between the top of the crystal and the wall. Key parameters involved in achieving detached growth are the contact angle between the melt and crucible and the pressure differential across the meniscus. Sessile drop measurements were used to determine the wetting angles of Ge(sub 1-x)Si(sub x) melts on a variety of substrates and found that the highest wetting angles were achieved with pyrolitic boron nitride (pBN). GeSi crystals have been repeatedly grown detached in pBN crucibles but only occasionally in crucibles with lower wetting angles. Experiments have been conducted to assess the effect of pressure differential across the meniscus in sealed crucibles. This was done by adjusting the temperature profile after partial melting of the starting material. In a separate set of experiments, the pressure was controlled by connecting the volume below the meniscus to a regulated gas supply. The experiments were in agreement with calculations which predicted that stable detachment will only occur in crucibles with a low wetting angle over a relatively narrow range of pressure differential. Detached-grown crystals exhibited superior structural quality as evidenced by measurements of etch pit density, synchrotron white beam X-ray topography and double axis X-ray diffraction.
Document ID
20090034391
Acquisition Source
Marshall Space Flight Center
Document Type
Conference Paper
Authors
Volz, M. P.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Croell, A.
(Freiburg Univ. Germany)
Mazuruk, K.
(Alabama Univ. Huntsville, AL, United States)
Date Acquired
August 24, 2013
Publication Date
August 9, 2009
Subject Category
Solid-State Physics
Report/Patent Number
M09-0621
M09-0437
Meeting Information
Meeting: 17th American Conference on Crystal Growth and Epitaxy/14th Biennial Workshop on Organometallic Vapor Phase Epitaxy/6th International Workshop on Modeling in Crystal Growth
Location: Lake Geneva, WI
Country: United States
Start Date: August 9, 2009
End Date: August 14, 2009
Sponsors: American Association for Crystal Growth
Distribution Limits
Public
Copyright
Public Use Permitted.
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