Acquisition Source
Jet Propulsion Laboratory
Document Type
Presentation
Authors
Chen, Yuan (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Sheldon, Doug (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Burke, Gary (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Roosta, Ramin (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Nguyen, Tien (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Date Acquired
August 25, 2013
Publication Date
September 8, 2005
Subject Category
Electronics And Electrical Engineering Meeting Information
Meeting: 2005 Military and Aerospace Programmable Logic Devices (MAPLD) Conference
Location: Washington, DC
Country: United States
Start Date: September 7, 2005
End Date: September 9, 2005
Distribution Limits
Public
Keywords
pixel reliabilityimaging sensorschip reliability