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Effect of Charging Electron Exposure on 1064nm Transmission Through Bare Sapphire Optics and SiO2 over HfO2 AR-Coated Sapphire OpticsExperiments measuring the effect of electron exposure on 1064nm transmission for optical sapphire were conducted. Detailed before and after inspections did not identify any resulting Litchenburg patterns. Pre- and post-exposure 1064nm transmission measurements are compared.
Document ID
20100019258
Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
Ottens, Brian P. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Connelly, Joseph (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Brown, Stephen (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Roeder, James (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Kauder, Lonny (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Cavanaugh, John (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
August 24, 2013
Publication Date
January 1, 2010
Subject Category
Optics
Meeting Information
Meeting: 26th Space Simulation Conference
Location: Annapolis, MD
Country: United States
Start Date: October 18, 2010
End Date: October 21, 2010
Distribution Limits
Public
Copyright
Public Use Permitted.

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