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A Software Risk ModelTopics on the slide include:quality, test coverage, functional criticality, exposure, criticality, and risk index.
Document ID
20100033141
Acquisition Source
Johnson Space Center
Document Type
Presentation
Authors
Lee, Alice
(NASA Johnson Space Center Houston, TX, United States)
Date Acquired
August 25, 2013
Publication Date
October 27, 2000
Subject Category
Computer Programming And Software
Report/Patent Number
JSC-CN-6422
Report Number: JSC-CN-6422
Meeting Information
Meeting: COMPSAC 2000 (Computer SW and Application) Conference
Location: Taipei
Country: Taiwan, Province of China
Start Date: October 25, 2000
End Date: October 27, 2000
Sponsors: Arizona State Univ., Institute of Electrical and Electronics Engineers
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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