Acquisition Source
Jet Propulsion Laboratory
Authors
Scheick, Leif (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Date Acquired
August 25, 2013
Publication Date
September 1, 2010
Subject Category
Electronics And Electrical Engineering Funding Number(s)
WBS: WBS 39904.01.11.30
PROJECT: JPL Proj. 102197
Distribution Limits
Public
Keywords
Single Event Gate Rupture (SEGR)Metal Oxide Semiconductor Field-Effect Transistor (MOSFETSingle Event Burnout (SEB)