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Measurement of Device Parameters Using Image Recovery Techniques in Large-Scale IC DevicesDevices that respond to radiation on a cell level will produce histograms showing the relative frequency of cell damage as a function of damage. The measured distribution is the convolution of distributions from radiation responses, measurement noise, and manufacturing parameters. A method of extracting device characteristics and parameters from measured distributions via mathematical and image subtraction techniques is described.
Document ID
20110015987
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
Authors
Scheick, Leif
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Edmonds, Larry
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
August 25, 2013
Publication Date
July 19, 2004
Subject Category
Nuclear Physics
Meeting Information
Meeting: IEEE Nuclear and Space Radiation Effects Conference
Location: Atlanta, GA
Country: United States
Start Date: July 19, 2004
Sponsors: Institute of Electrical and Electronics Engineers
Distribution Limits
Public
Copyright
Other
Keywords
radiation
convolution
microdose

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