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Single-Event Effect (SEE) Survey of Advanced Reconfigurable Field Programmable Gate Arrays: NASA Electronic Parts and Packaging (NEPP) Program Office of Safety and Mission AssuranceThe NEPP Reconfigurable Field-Programmable Gate Array (FPGA) task has been charged to evaluate reconfigurable FPGA technologies for use in space. Under this task, the Xilinx single-event-immune, reconfigurable FPGA (SIRF) XQR5VFX130 device was evaluated for SEE. Additionally, the Altera Stratix-IV and SiliconBlue iCE65 were screened for single-event latchup (SEL).
Document ID
20120001664
Acquisition Source
Jet Propulsion Laboratory
Document Type
Other
External Source(s)
Authors
Allen, Gregory
Date Acquired
August 25, 2013
Publication Date
December 1, 2011
Report/Patent Number
JPL-Publ-11-18
Distribution Limits
Public
Copyright
Other
Keywords
Xilinx Single-Event Effects (SEE) Test Consortium
single-event functional interrupt (SEFI)
single-event upset (SEU)
Reconfigurable Field-Programmable Gate Array (FPGA)

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