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Physics Based Electrolytic Capacitor Degradation Models for Prognostic Studies under Thermal OverstressElectrolytic capacitors are used in several applications ranging from power supplies on safety critical avionics equipment to power drivers for electro-mechanical actuators. This makes them good candidates for prognostics and health management research. Prognostics provides a way to assess remaining useful life of components or systems based on their current state of health and their anticipated future use and operational conditions. Past experiences show that capacitors tend to degrade and fail faster under high electrical and thermal stress conditions that they are often subjected to during operations. In this work, we study the effects of accelerated aging due to thermal stress on different sets of capacitors under different conditions. Our focus is on deriving first principles degradation models for thermal stress conditions. Data collected from simultaneous experiments are used to validate the desired models. Our overall goal is to derive accurate models of capacitor degradation, and use them to predict performance changes in DC-DC converters.
Document ID
20120016836
Acquisition Source
Ames Research Center
Document Type
Conference Paper
Authors
Kulkarni, Chetan S.
(Vanderbilt Univ. Nashville, TN, United States)
Celaya, Jose R.
(Stinger Ghaffarian Technologies, Inc. (SGT, Inc.) Moffett Field, CA, United States)
Goebel, Kai
(NASA Ames Research Center Moffett Field, CA, United States)
Biswas, Gautam
(Vanderbilt Univ. Nashville, TN, United States)
Date Acquired
August 26, 2013
Publication Date
July 3, 2012
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
ARC-E-DAA-TN5005
Meeting Information
Meeting: First European Conference of the Prognostics and Health
Location: Dresden
Country: Germany
Start Date: July 3, 2012
Sponsors: PHM Society
Funding Number(s)
CONTRACT_GRANT: NNA08CG83C
Distribution Limits
Public
Copyright
Public Use Permitted.
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