Acquisition Source
Jet Propulsion Laboratory
Document Type
Presentation
Authors
Greer, Frank (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Lee, M. C. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Hoenk, M. E. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Jones, T. J. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Jacquot, B. C. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Dickie, M. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Monacos, S. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Nikzad, S. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Day, P. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Leduc, R. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Hamden, E. (Columbia Univ. United States) Schiminovich, D. (Columbia Univ. United States) Beasley, M. (Colorado Univ. Boulder, CO, United States) Gantner, B. (Colorado Univ. Boulder, CO, United States) Morrissey, P. (California Inst. of Tech. Pasadena, CA, United States) Martin, C. (California Inst. of Tech. Pasadena, CA, United States) Date Acquired
August 27, 2013
Publication Date
June 20, 2012
Meeting Information
Meeting: Atomic Layer Deposition 2012
Location: Dresden
Country: Germany
Start Date: June 17, 2012
End Date: June 20, 2012
Distribution Limits
Public
Keywords
Anti?reflective coatingsOptical elementsSuperconducting detectors