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Bayesian Framework Approach for Prognostic Studies in Electrolytic Capacitor under Thermal Overstress ConditionsElectrolytic capacitors are used in several applications ranging from power supplies for safety critical avionics equipment to power drivers for electro-mechanical actuator. Past experiences show that capacitors tend to degrade and fail faster when subjected to high electrical or thermal stress conditions during operations. This makes them good candidates for prognostics and health management. Model-based prognostics captures system knowledge in the form of physics-based models of components in order to obtain accurate predictions of end of life based on their current state of heal th and their anticipated future use and operational conditions. The focus of this paper is on deriving first principles degradation models for thermal stress conditions and implementing Bayesian framework for making remaining useful life predictions. Data collected from simultaneous experiments are used to validate the models. Our overall goal is to derive accurate models of capacitor degradation, and use them to remaining useful life in DC-DC converters.
Document ID
20130001673
Acquisition Source
Ames Research Center
Document Type
Conference Paper
Authors
Kulkarni, Chetan S.
(Vanderbilt Univ. Nashville, TN, United States)
Celaya, Jose R.
(Stinger Ghaffarian Technologies, Inc. (SGT, Inc.) Moffett Field, CA, United States)
Goebel, Kai
(NASA Ames Research Center Moffett Field, CA, United States)
Biswas, Gautam
(Vanderbilt Univ. Nashville, TN, United States)
Date Acquired
August 27, 2013
Publication Date
September 23, 2012
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
ARC-E-DAA-TN5953
Meeting Information
Meeting: Annual Conference of the PHM Society 2012
Location: Minneapolis, MN
Country: United States
Start Date: September 23, 2012
End Date: September 27, 2012
Funding Number(s)
CONTRACT_GRANT: NNA08CG83C
Distribution Limits
Public
Copyright
Public Use Permitted.
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