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Compendium of Single-Event Latchup and Total Ionizing Dose Test Results of Commercial Analog to Digital ConvertersThis paper reports single-event latchup and total dose results for a variety of analog to digital converters targeted for possible use in NASA spacecraft's. The compendium covers devices tested over the last 15 years.
Document ID
20130009092
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
hdl:2014/42689
Authors
Irom, Farokh (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Agarwal, Shri G. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
August 27, 2013
Publication Date
July 16, 2012
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: IEEE Nuclear and Space Radiation Effects Conference (NSREC 2012)
Location: Miami, FL
Country: United States
Start Date: July 16, 2012
End Date: July 20, 2012
Distribution Limits
Public
Copyright
Other
Keywords
A/D converter (ADC)
electronic hardware
critical components

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