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Characterization of Radiation Hardened Bipolar Linear Devices for High Total Dose MissionsRadiation hardened linear devices are characterized for performance in combined total dose and displacement damage environments for a mission scenario with a high radiation level. Performance at low and high dose rate for both biased and unbiased conditions is compared and the impact to hardness assurance methodology is discussed.
Document ID
20130009193
Document Type
Conference Paper
External Source(s)
Authors
McClure, Steven S.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Harris, Richard D.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Rax, Bernard G.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Thorbourn, Dennis O.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
August 27, 2013
Publication Date
July 19, 2012
Subject Category
Electronics And Electrical Engineering
Meeting Information
IEEE Nuclear and Space Radiation Effects Conference (NSREC 2012)(Miami, FL)
Distribution Limits
Public
Copyright
Other
Keywords
Enhanced Low Dose Rate Sensitivity (ELDRS)
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