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Characterization of Radiation Hardened Bipolar Linear Devices for High Total Dose MissionsRadiation hardened linear devices are characterized for performance in combined total dose and displacement damage environments for a mission scenario with a high radiation level. Performance at low and high dose rate for both biased and unbiased conditions is compared and the impact to hardness assurance methodology is discussed.
Document ID
20130009193
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
hdl:2014/42692
Authors
McClure, Steven S. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Harris, Richard D. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Rax, Bernard G. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Thorbourn, Dennis O. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
August 27, 2013
Publication Date
July 19, 2012
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: IEEE Nuclear and Space Radiation Effects Conference (NSREC 2012)
Location: Miami, FL
Country: United States
Start Date: July 16, 2012
End Date: July 20, 2012
Sponsors: Institute of Electrical and Electronics Engineers
Distribution Limits
Public
Copyright
Other
Keywords
Enhanced Low Dose Rate Sensitivity (ELDRS)

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