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Non Volatile Flash Memory Radiation TestsCommercial flash memory industry has experienced a fast growth in the recent years, because of their wide spread usage in cell phones, mp3 players and digital cameras. On the other hand, there has been increased interest in the use of high density commercial nonvolatile flash memories in space because of ever increasing data requirements and strict power requirements. Because of flash memories complex structure; they cannot be treated as just simple memories in regards to testing and analysis. It becomes quite challenging to determine how they will respond in radiation environments.
Document ID
20130009336
Document Type
Presentation
External Source(s)
Authors
Irom, Farokh (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Nguyen, Duc N. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Allen, Greg (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
August 27, 2013
Publication Date
June 11, 2012
Subject Category
Electronics and Electrical Engineering
Meeting Information
3rd NASA Electronic Parts and Packaging (NEPP) Program Electronic Technology Workshop(Greenbelt, MD)
Distribution Limits
Public
Copyright
Other
Keywords
single event upset results
flash memory
Single Event Functionality Interrupt (SEFI)