Acquisition Source
Jet Propulsion Laboratory
Authors
Guertin, Steven M. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Allen, Gregory R. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Sheldon, Douglas J. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Date Acquired
August 27, 2013
Publication Date
July 16, 2012
Subject Category
Systems Analysis And Operations Research Meeting Information
Meeting: IEEE Nuclear and Space Radiation Effects Conference (NSREC 2012)
Location: Miami, FL
Country: United States
Start Date: July 16, 2012
End Date: July 20, 2012
Sponsors: Institute of Electrical and Electronics Engineers
Distribution Limits
Public
Keywords
Single Event Functionality Interrupt (SEFI)multiple bit errors (MBEs)program impactSynchronous Dynamic Random Access Memories (SDRAMs)