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Programmatic Impact of SDRAM SEFIThe Elpida EDS5104(08)ABTA 512Mb SDRAM is examined for programmatic impact of SEE. Use cases for the devices including EDAC and mode register reload are examined. Results indicate some SEE mitigation methods require careful application to achieve system-level benefits, while some event types are essentially mitigated by the application use. In the studied devices MBE and SEFI are identified and investigated as mechanisms requiring special consideration.
Document ID
20130009374
Acquisition Source
Jet Propulsion Laboratory
Document Type
Other
External Source(s)
Authors
Guertin, Steven M.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Allen, Gregory R.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Sheldon, Douglas J.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
August 27, 2013
Publication Date
July 16, 2012
Subject Category
Systems Analysis And Operations Research
Meeting Information
Meeting: IEEE Nuclear and Space Radiation Effects Conference (NSREC 2012)
Location: Miami, FL
Country: United States
Start Date: July 16, 2012
End Date: July 20, 2012
Sponsors: Institute of Electrical and Electronics Engineers
Distribution Limits
Public
Copyright
Other
Keywords
Single Event Functionality Interrupt (SEFI)
multiple bit errors (MBEs)
program impact
Synchronous Dynamic Random Access Memories (SDRAMs)

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