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Compendium of Recent Test Results of Single Event Effects Conducted by the Jet Propulsion LaboratoryThis paper reports heavy ion, proton, and laser induced single event effects results for a variety of microelectronic devices targeted for possible use in NASA spacecrafts. The compendium covers devices tested within the years of 2010 through 2012.
Document ID
20130009375
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
hdl:2014/42688
Authors
Allen, Gregory R. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Guertin, Steven M. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Scheick, Leif Z. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Irom, Farokh (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Zajac, Stephanie (State Univ. of New York Stony Brook, NY, United States)
Date Acquired
August 27, 2013
Publication Date
July 16, 2012
Subject Category
Spacecraft Design, Testing And Performance
Meeting Information
Meeting: IEEE Nuclear and Space Radiation Effects Conference
Location: Miami, FL
Country: United States
Start Date: July 16, 2012
End Date: July 20, 2012
Distribution Limits
Public
Copyright
Other
Keywords
reliability
single event functional interrupt (SEFI)
Single Event Effects (SEE)
microelectronic technologies

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