NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Subpicometer Length Measurement Using Semiconductor Laser Tracking Frequency GaugeWe have demonstrated heretofore unattained distance precision of 0:14pm (2pm) incremental and 14nm (2.9 micrometers) absolute in a resonant (nonresonant) interferometer at an averaging time of 1 s, using inexpensive telecommunications diode lasers. We have controlled the main source of error, that due to spurious reflection and the resulting amplitude modulation. In the resonant interferometer, absolute distance precision is well under lambda/6. Therefore, after an interruption, an absolute distance measurement can be used to return to the same interferometer order.
Document ID
20130009923
Acquisition Source
Headquarters
Document Type
Reprint (Version printed in journal)
Authors
Thapa, Rajesh
(Smithsonian Astrophysical Observatory Cambridge, MA, United States)
Phillips, James D.
(Smithsonian Astrophysical Observatory Cambridge, MA, United States)
Rocco, Emanuele
(Smithsonian Astrophysical Observatory Cambridge, MA, United States)
Reasenburg, Robert D.
(Smithsonian Astrophysical Observatory Cambridge, MA, United States)
Date Acquired
August 27, 2013
Publication Date
October 1, 2011
Publication Information
Publication: Optics Letters
Volume: 36
Issue: 19
Subject Category
Instrumentation And Photography
Funding Number(s)
CONTRACT_GRANT: NNX08AO04G
CONTRACT_GRANT: NNX07AI11G
Distribution Limits
Public
Copyright
Other

Available Downloads

There are no available downloads for this record.
No Preview Available