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Surface Inspection Tool for Optical Detection of Surface DefectsThe Space Shuttle Orbiter windows were damaged both by micrometeor impacts and by handling, and required careful inspection before they could be reused. The launch commit criteria required that no defect be deeper than a critical depth. The shuttle program used a refocus microscope to perform a quick pass/fail determination, and then followed up with mold impressions to better quantify any defect. However, the refocus microscope is slow and tedious to use due to its limited field of view, only focusing on one small area of glass at a time. Additionally, the unit is bulky and unable to be used in areas with tight access, such as defects near the window frame or on the glass inside the Orbiter due to interference with the dashboard. The surface inspection tool is a low-profile handheld instrument that provides two digital video images on a computer for monitoring surface defects. The first image is a wide-angle view to assist the user in locating defects. The second provides an enlarged view of a defect centered in the window of the first image. The focus is adjustable for each of the images. However, the enlarged view was designed to have a focal plane with a short depth. This allows the user to get a feel for the depth of different parts of the defect under inspection as the focus control is varied. A light source is also provided to illuminate the defect, precluding the need for separate lighting tools. The software provides many controls to adjust image quality, along with the ability to zoom digitally the images and to capture and store them for later processing.
Document ID
20130012686
Acquisition Source
Kennedy Space Center
Document Type
Other - NASA Tech Brief
Authors
Nurge, Mark
(NASA Kennedy Space Center Cocoa Beach, FL, United States)
Youngquist, Robert
(NASA Kennedy Space Center Cocoa Beach, FL, United States)
Dyer, Dustin
(NASA Kennedy Space Center Cocoa Beach, FL, United States)
Date Acquired
August 27, 2013
Publication Date
April 1, 2013
Publication Information
Publication: NASA Tech Briefs, April 2013
Subject Category
Instrumentation And Photography
Report/Patent Number
KSC-13580
Distribution Limits
Public
Copyright
Public Use Permitted.
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