Document Type
Presentation
Authors
Patterson, Richard L. (NASA Glenn Research Center Cleveland, OH United States) Boomer, Kristen T. (NASA Glenn Research Center Cleveland, OH United States) Scheick, Leif (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Lauenstein, Jean-Marie (NASA Goddard Space Flight Center Greenbelt, MD, United States) Casey, Megan (NASA Goddard Space Flight Center Greenbelt, MD, United States) Hammoud, Ahmad (Vantage Partners, LLC Brook Park, OH, United States) Date Acquired
July 31, 2014
Publication Date
June 17, 2014
Subject Category
Quality Assurance And ReliabilityElectronics And Electrical Engineering Meeting Information
Annual NASA Electronic Parts and Packaging (NEPP) Program Electronic Technology Workshop (ETW)(Greenbelt, MD)
Funding Number(s)
CONTRACT_GRANT: NNC12BA01B
WBS: WBS 724297.40.49.03.01
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
thermal cycling testsextraterrestrial radiationfield effect transistor Available Downloads
20140010370.pdf STIcloud_downloadcontent_copyvisibility