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Xilinx Virtex-5QV (V5QV) Independent SEU Data
NTRS Full-Text: Click to View  [PDF Size: 1.5 MB]
Author and Affiliation:
Berg, Melanie D.(ASRC Federal Space and Defense, Greenbelt, MD, United States)
LaBel, Kenneth A.(NASA Goddard Space Flight Center, Greenbelt, MD United States)
Pellish, Jonathan(NASA Goddard Space Flight Center, Greenbelt, MD United States)
Abstract: This is an independent study to determine the single event destructive and transient susceptibility of the Xilinx Virtex-5QV (SIRF) device. A framework for evaluating complex digital systems targeted for harsh radiation environments such as space is presented.
Publication Date: Jun 17, 2014
Document ID:
20140017350
(Acquired Jun 03, 2015)
Subject Category: ELECTRONICS AND ELECTRICAL ENGINEERING
Report/Patent Number: GSFC-E-DAA-TN16271, GSFC-E-DAA-TN15144
Document Type: Oral/Visual Presentation
Meeting Information: NASA Electronic Parts and Packaging (NEPP) Electronics Technology Workshop (ETW); June 17-19, 2014; Greenbelt, MD; United States
Meeting Sponsor: NASA Goddard Space Flight Center; Greenbelt, MD United States
Defense Threat Reduction Agency; Fort Belvoir, VA, United States
Contract/Grant/Task Num: NNG13CR48C
Financial Sponsor: NASA Goddard Space Flight Center; Greenbelt, MD United States
Organization Source: NASA Goddard Space Flight Center; Greenbelt, MD United States
Description: 76p; In English; Original contains color illustrations
Distribution Limits: Unclassified; Publicly available; Unlimited
Rights: Copyright; Distribution as joint owner in the copyright
NASA Terms: SINGLE EVENT UPSETS; FIELD-PROGRAMMABLE GATE ARRAYS; RADIATION DAMAGE; RADIATION TOLERANCE; PERFORMANCE TESTS; ELECTRONIC EQUIPMENT TESTS; CIRCUITS
Other Descriptors: FIELD PROGRAMMABLE GATE ARRAY (FPGA); SINGLE EVENT UPSET (SEU) TESTING; VIRTEX-5QV
Miscellaneous Notes: Presentation for website
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