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Xilinx Virtex-5QV (V5QV) Independent SEU DataThis is an independent study to determine the single event destructive and transient susceptibility of the Xilinx Virtex-5QV (SIRF) device. A framework for evaluating complex digital systems targeted for harsh radiation environments such as space is presented.
Document ID
20140017350
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
Berg, Melanie D. (ASRC Federal Space and Defense Greenbelt, MD, United States)
LaBel, Kenneth A. (NASA Goddard Space Flight Center Greenbelt, MD United States)
Pellish, Jonathan (NASA Goddard Space Flight Center Greenbelt, MD United States)
Date Acquired
December 12, 2014
Publication Date
June 17, 2014
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
GSFC-E-DAA-TN15144
GSFC-E-DAA-TN16271
Meeting Information
Meeting: NASA Electronic Parts and Packaging (NEPP) Electronics Technology Workshop (ETW)
Location: Greenbelt, MD
Country: United States
Start Date: June 17, 2014
End Date: June 19, 2014
Sponsors: Defense Threat Reduction Agency, NASA Goddard Space Flight Center
Funding Number(s)
CONTRACT_GRANT: NNG13CR48C
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
Field Programmable Gate Array (FPGA)
Virtex-5QV
Single Event Upset (SEU) Testing

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